SR4 系列光谱仪

高信噪比和热稳定性

SR4 光谱仪应用广泛、坚固耐用，具有出色的信噪比和热稳定性，适用于等离子体监测和反射测量等应用。光谱仪采用阵列式CCD探测器，具有低电子噪音性能，可获得准确可靠的测量结果。

SR4 系列

组别	Part Number	波长范围	分辨率	狭缝尺寸	刻线密度(刻线/毫米)	闪耀波段
UV options:	SR-4UV220-5	190 – 410 nm	0.42 nm	5 μm	1800	Holographic
	SR-4UV220-10	190 – 410 nm	0.46 nm	10 μm	1800	Holographic
	SR-4UV220-25	190 – 410 nm	0.60 nm	25 μm	1800	Holographic
	SR-4UV220-50	190 – 410 nm	0.93 nm	50 μm	1800	Holographic
	SR-4UV220-100	190 – 410 nm	1.68 nm	100 μm	1800	Holographic
	SR-4UV220-200	190 – 410 nm	3.36 nm	200 μm	1800	Holographic
	SR-4UV240-5	190 – 535 nm	0.58 nm	5 μm	1200	Holographic
	SR-4UV240-10	190 – 535 nm	0.63 nm	10 μm	1200	Holographic
	SR-4UV240-25	190 – 535 nm	0.83 nm	25 μm	1200	Holographic
	SR-4UV240-50	190 – 535 nm	1.28 nm	50 μm	1200	Holographic
	SR-4UV240-100	190 – 535 nm	2.31 nm	100 μm	1200	Holographic
	SR-4UV240-200	190 – 535 nm	4.62 nm	200 μm	1200	Holographic
UV-Vis options:	SR-4UVV240-5	190 – 850 nm	1.17 nm	5 μm	600	240 nm
	SR-4UVV240-10	190 – 850 nm	1.25 nm	10 μm	600	240 nm
	SR-4UVV240-25	190 – 850 nm	1.65 nm	25 μm	600	240 nm
	SR-4UVV240-50	190 – 850 nm	2.55 nm	50 μm	600	240 nm
	SR-4UVV240-100	190 – 850 nm	4.62 nm	100 μm	600	240 nm
	SR-4UVV240-200	190 – 850 nm	9.24 nm	200 μm	600	240 nm
	SR-4UVV300-5	190 – 910 nm	1.17 nm	5 μm	600	300 nm
	SR-4UVV300-10	190 – 910 nm	1.25 nm	10 μm	600	300 nm
	SR-4UVV300-25	190 – 910 nm	1.65 nm	25 μm	600	300 nm
	SR-4UVV300-50	190 – 910 nm	2.55 nm	50 μm	600	300 nm
	SR-4UVV300-100	190 – 910 nm	4.62 nm	100 μm	600	300 nm
	SR-4UVV300-200	190 – 910 nm	9.24 nm	200 μm	600	300 nm
	SR-4UVV400-5	190 – 910 nm	1.17 nm	5 μm	600	400 nm
	SR-4UVV400-10	190 – 910 nm	1.25 nm	10 μm	600	400 nm
	SR-4UVV400-25	190 – 910 nm	1.65 nm	25 μm	600	400 nm
	SR-4UVV400-50	190 – 910 nm	2.55 nm	50 μm	600	400 nm
	SR-4UVV400-100	190 – 910 nm	4.62 nm	100 μm	600	400 nm
	SR-4UVV400-200	190 – 910 nm	9.24 nm	200 μm	600	400 nm
Ethernet options:	SR-4UVV300EN-25	190 – 910 nm	1.65 nm	25 μm	600	300 nm
Vis options:	SR-4VIS400-5	350 – 1040 nm	1.17 nm	5 μm	600	400 nm
	SR-4VIS400-10	350 – 1040 nm	1.25 nm	10 μm	600	400 nm
	SR-4VIS400-25	350 – 1040 nm	1.65 nm	25 μm	600	400 nm
	SR-4VIS400-50	350 – 1040 nm	2.55 nm	50 μm	600	400 nm
	SR-4VIS400-100	350 – 1040 nm	4.62 nm	100 μm	600	400 nm
	SR-4VIS400-200	350 – 1040 nm	9.24 nm	200 μm	600	400 nm
Vis-NIR options:	SR-4VN500-5	350 – 1040 nm	1.17 nm	5 μm	600	500 nm
	SR-4VN500-10	350 – 1040 nm	1.25 nm	10 μm	600	500 nm
	SR-4VN500-25	350 – 1040 nm	1.65 nm	25 μm	600	500 nm
	SR-4VN500-50	350 – 1040 nm	2.55 nm	50 μm	600	500 nm
	SR-4VN500-100	350 – 1040 nm	4.62 nm	100 μm	600	500 nm
	SR-4VN500-200	350 – 1040 nm	9.24 nm	200 μm	600	500 nm
NIR options:	SR-4N750-5	570 – 860 nm	0.58 nm	5 μm	1200	750 nm
	SR-4N750-10	570 – 860 nm	0.63 nm	10 μm	1200	750 nm
	SR-4N750-25	570 – 860 nm	0.83 nm	25 μm	1200	750 nm
	SR-4N750-50	570 – 860 nm	1.28 nm	50 μm	1200	750 nm
	SR-4N750-100	570 – 860 nm	2.31 nm	100 μm	1200	750 nm
	SR-4N750-200	570 – 860 nm	4.62 nm	200 μm	1200	750 nm
	SR-4N1000-5	600 – 1050 nm	1.17 nm	5 μm	600	1000 nm
	SR-4N1000-10	600 – 1050 nm	1.25 nm	10 μm	600	1000 nm
	SR-4N1000-25	600 – 1050 nm	1.65 nm	25 μm	600	1000 nm
	SR-4N1000-50	600 – 1050 nm	2.55 nm	50 μm	600	1000 nm
	SR-4N1000-100	600 – 1050 nm	4.62 nm	100 μm	600	1000 nm
	SR-4N1000-200	600 – 1050 nm	9.24 nm	200 μm	600	1000 nm
Extended-range options:	SR-4XR250-5	190 – 1050 nm	1.43 nm	5 μm	500	250 nm
	SR-4XR250-10	190 – 1050 nm	1.54 nm	10 μm	500	250 nm
	SR-4XR250-25	190 – 1050 nm	2.03 nm	25 μm	500	250 nm
	SR-4XR250-50	190 – 1050 nm	3.13 nm	50 μm	500	250 nm
	SR-4XR250-100	190 – 1050 nm	5.67 nm	100 μm	500	250 nm
	SR-4XR250-200	190 – 1050 nm	11.34 nm	200 μm	500	250 nm
积分时间	3.8 ms – 10 s
信噪比（单次扫描）	250:1
信噪比（高速平均模式）	3,000:1
接口	16 pin Samtec TFM, RS-232, SMA, USB Type-C
尺寸	88.1 x 63.5 x 31.45 mm
重量	275 g
工作温度	0 °C – 55 °C
储存温度	-30 °C – 70 °C
适合的应用	Absorbance at low stray light levels Emission line analysis in gases and plasmas High-resolution ethanol-water analysis in teaching labs and QA/QC environments where spectral detail is key Reflectance of solid samples

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